2000

Evaluation and follow-up advanced visual field defects with semi-automated kinetic perimetry (S-AKP).

von Ulrich, Schiefer

Schiefer U, Schiller J, Paetzold J, Benda N, Vonthein R, Dietrich TJ (2000) Evaluation and follow-up advanced visual field defects with semi-automated kinetic perimetry (S-AKP). Invest Ophthalmol Vis Sci 41:295