Visual field defects in acute optic neuritis – distribution of different types of defect pattern, assessed with threshold-related supraliminal perimetry ensuring high spatial resolution
von Ulrich, Schiefer
Nevalainen J, Krapp E, Paetzold J, Mildenberger I, Besch D, Vonthein R, Keltner JL, Johnson CA, Schiefer U (2008) Visual field defects in acute optic neuritis – distribution of different types of defect pattern, assessed with threshold-related supraliminal perimetry ensuring high spatial resolution, Graefes Arch Clin Exp Ophthalmol, 246:599-607