Correlative Light and Electron Microscopy (CLEM) for Characterization of Lithium Ion Battery Materials
von Gerhard, Schneider
Ch. Thomas, M. Edelmann, C. Hafner, T. Bernthaler, G. Schneider: “Correlative Light and Electron Microscopy (CLEM) for Characterization of Lithium Ion Battery Materials”, Microscopy and Microanalysis 16 (2010), 784-785,